Daniel Arumi

Daniel Arumí

Research interests

Test & Diagnosis of ICs

The continued demand for better performance of Integrated Circuits (ICs) leads to a dramatic increase in the effects of miniaturization. Among the main causes that threaten reliability are manufacturing defects, the variability of both the manufacturing process itself and operating conditions of the circuit and aging. In this context, implementation of new strategies that improve robustness and assure quality specifications of the final product are dramatically needed. Furthermore, to continue the level of miniaturization, one of the most promising recent alternative is stacking dice of silicon integrated circuits in the so called 3D integration.Nevertheless, the introduction of 3D-ICs involves the emergence of new challenges that will change the paradigms of the test.

IC Security

In the present society, information security is a key factor due to the increasing number and sophistication of malicious threats and attacks. One of the most critical cases is related with portable devices, where the information is protected using a secure key stored in a non-volatile memory, which has demonstrated to be vulnerable. One way to improve the security in these applications is by means of PUFs (Physical Unclonable Functions). These primitives allow, from the variability of the fabrication process of ICs (Intregrated Circuits), obtaining random bits to generate a secret key. Although different architectures of PUFs have been proposed, their massive utilization still presents some challenges due to the nanometric nature of the technology. In this context, emerging memories arise as promising candidates for security applications. Nevertheless, their viability must still be confirmed due to their technological immaturity.

Teaching

My teaching activity takes place in the Escola d'Enginyeria d'Igualada (EEI), attached to the Universitat Politècnica de Catalunya (UPC).

I teach Basic Electronics as well as other more basic engineering courses.

Publications

UPC futur portal